Coating Solutions for Semiconductor Test Probes
C3 (Conductive Carbon Contact) Coating
Kobelco Research Institute’s Materials Business Division introduces high-performance coating solutions for probes used in semiconductor testing processes.
Through proprietary material design and coating technologies, we have realized DLC coatings with low electrical resistance, high hardness, and low friction.This contribute to prevent solder adhesion on test probe pins and improved wear resistance.
The coating has been widely adopted by many manufacturers, particularly in back-end processes.
Responsible Company: Kobelco Research Institute, Inc. (Japanese site)
Key Points
- Low-resistance conductive DLC coating
- High hardness and low friction
Benefits
- Reduction of False-fail and cleaning frequency
- Long life of probes for semiconductor test process
Features
By applying C3 coating to the tip of semiconductor test probes, solder is efficiently removed from the probe tip.
The contact resistance of the test probe remains stable over the long term.
Product lineup
Standard lineup
| Grade | Features | |||
|---|---|---|---|---|
| R | Standard Grade | |||
| C | Lower resistance Grade | |||
| E | Non Oxidation Grade | |||
| B | Non Magnetic Grade | |||
- Grade selection
- Materials and shapes with a proven track record of C3 coating
- Consultation available for applications beyond probes
Contact Us
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